The ElvaX Art analyzer is a new unit to joint the family of portable X-Ray Fluorescence (EDXRF) Spectrometer systems produced by Elvatech Ltd. This mobile spectrometer, portable system, designed specifically for art analysis, includes a CCD camera and small beam. This makes it possible to accurately measure a small selected section of an immobile artifact, painting, or metal article. The ElvaX Art system is designed to be used with the ElvaX software package and a desktop or laptop computer, creating a powerful tool, more versatile than typical handheld or desktop systems. Compared to other techniques, ElvaX Art Analyzer has the advantage of being non-destructive, multi-elemental, fast, and cost-effective.
The analytical head of the ElvaX Art Spectrometer can be mounted on the manual or motorized dual-axis positioning stage, or on the robotized arm for onsite analysis.
The ElvaX Art system can be used to qualitatively analyze and identify elements in mineral pigments, such as Titanium, Lead, Chromium, Copper, Zinc, Iron, etc. Additionally, it will determine elements in glass, ceramic and obsidian, as well as precious & non-precious metals assay. ElvaX Art can also be utilized for stone tool and metal artifact identification or with numerous museum artifacts.
With non-destructive X-Ray Fluorescence, objects and samples remain intact and unharmed.
- Painting authentication
- Investigation of cultural heritage
- Art restoration
- Ceramic items
- Archeology and archeometry
- Metals and alloys
Measurement Capabilities
| Detectable range | Cl (17) – Pu (94) |
| Optional light elements range | Mg (12) – S (16) |
| Detectable concentration | below 10 PPM for most elements in a light Matrix |
Chamber
| Beam size | 0.2 mm to 4 mm, manual |
| Dimensions | 174 x 143 x 172 mm |
| Weight | 2.5 kg |
| Power Supply | 100 – 240 volt ac 50/60 Hz,
50 Watts Max Power Consumption |
| Video Screen | TFT LCD screen size is 5”, 10x magnification |
| Data Acquisition time | 10 – 1200 sec. |
X-Ray Generation information
| W target anode, 250 um Be window, (optional Ag anode 125 um Be window for improved light elements sensitivity) X-Ray tube, air cooled |
| 4 – 40 kV (adjustable in 0.1 kV steps), Tube Current 0 – 100 uA (0.2 uA steps) 5 W max |
X-Ray Detection
| Si – Pin Diode (optional SDD), Thermoelectrically cooled |
| Detector resolution 160 eV; Mn (<140 eV for SDD) |
| Be 12 um window |
