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DENVER X-RAY CONFERENCE / 6–10 AUGUST 2012


DENVER X-RAY CONFERENCE / 6–10 AUGUST 2012

08.08.2012

DENVER X-RAY CONFERENCE / 6–10 august 2012

DENVER MARRIOTT TECH CENTER HOTEL / DENVER, COLORADO, U.S.A.

WORKSHOPS MONDAY & TUESDAY 6–7 AUGUST
AM Workshops 9:00 am– 12:00 pm ---- PM Workshops 1:30 pm– 4:30 pm

Monday am - XRD & XRF
3D Imaging – Sponsored by Xradia | Evergreen A
Organizer & Instructors:
B. Patterson, Los Alamos National Laboratory, Los Alamos, NM, bpatterson@lanl.gov
M. De Graef, Carnegie Mellon University, Pittsburgh, PA
R. Ketcham, The University of Texas at Austin, Austin, TX
R.M. Suter, Carnegie Mellon University, Pittsburgh, PA

The use of three dimensional X-ray imaging, especially computed tomography (CT), has exploded over the past 10 years. Many researchers use it, but few to no courses exist in the basics of operation. This workshop will focus on the basics of X-ray CT, both laboratory and synchrotron sources, how radiography is collected at the different length scales, reconstructed into 3D data sets, and data sets processed. Building upon X-ray absorption imaging, 3D X-ray diffraction imaging will be explored.

Monday am XRD
Residual Stress | Evergreen B
Organizer & Instructors:
I.C. Noyan, Columbia University, New York, NY, icn2@columbia.edu
C.E. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY
C. Goldsmith, IBM, Hopewell Junction, NY

This workshop will cover the basic theory and experimental technique of stress/strain determination with X-ray and neutron diffraction. In addition, error analysis and techniques to check accuracy, precision and resolution of stress measurement instruments will be discussed.

Nanostructures I | Evergreen C
Organizer & Instructor:
V. Petkov, Central Michigan University, Mt. Pleasant, MI, petkov@phy.cmich.edu

This full day workshop will start with a brief introduction and continue with hands–on training on the atomic pair distribution function
analysis, from XRD data reduction into atomic PDFs to structure determination based on atomic PDFs.
…and come to the workshop with their laptops. Attendees are also encouraged to bring data sets of their own.
Monday am XRF
Basic XRF | Evergreen D
Organizers & Instructors:
W.T. Elam, University of Washington APL, Seattle, WA, wtelam@apl.washington.edu
G.J. Havrilla, Los Alamos National Laboratory, Los Alamos, NM, havrilla@lanl.gov

This workshop provides a basic introduction to the principles of XRF, and is specifically aimed at those new to the field. It will start with a general overview of the technique, followed by more specific details of the basic principles. The emphasis will be on understanding how to use XRF and what its capabilities are. In the second half of the workshop, a few selected applications will be presented. The focus of this segment will be to provide an understanding of how the basic principles affect actual practice.
Monday pm XRD & XRF
X-ray Reflectivity | Evergreen A
Organizer & Instructors:
K. Sakurai, National Institute for Materials Science (NIMS) and University of Tsukuba, Tsukuba, Japan, sakurai@yuhgiri.nims.go.jp
W.-L. Wu, NIST, Gaithersburg, MD
R. Matyi, University at Albany - SUNY, Albany, NY
V. Samson, University of Tsukuba, Tsukuba, Japan
K. Ueda, Hitachi Ltd., Saitama, Japan

The workshop topics will include:
• What is X-ray Reflectivity?
• Application to Semiconductor and Magnetic Multilayers
• Application to Nano Technology
• Tips for data analysis

Monday pm XRD
Two-Dimensional Detectors | Evergreen B
Organizers & Instructors:
T.N. Blanton, Eastman Kodak Company Research Labs, Rochester, NY, thomas.blanton@kodak.com
B.B. He, Bruker AXS, Inc., Madison, WI, bob.he@bruker-axs.com
T. Taguchi, Rigaku Corporation, Tokyo, Japan, takey@rigaku.co.jp
M. Fransen, PANalytical B.V., Almelo, The Netherlands

Two-dimensional diffraction data contain abundant information about the atomic arrangement, microstructure, and defects of a solid or liquid material. In recent years, the use of two-dimensional detectors has dramatically increased in academic, government and industrial laboratories. This workshop covers recent progress in two-dimensional X-ray diffraction in terms of detector technology, data collection strategy, data evaluation algorithms and software, and instrument configurations. In addition to new hardware developments, various application examples, such as phase ID, texture, stress, crystallinity, combinational screening and thin film analysis will be discussed.
Nanostructures II | Evergreen C
Organizer & Instructor:
V. Petkov, Central Michigan University, Mt. Pleasant, MI, petkov@phy.cmich.edu

Continuation of Nanostructures I.

Monday pm XRF
Energy Dispersive XRF | Evergreen D
Organizer & Instructors:
R. Phillips, Thermo Fisher Scientific, West Palm Beach, FL, rich.phillips@thermofisher.com
R. Cone, Thermo Fisher Scientific, West Palm Beach, FL
A. McWilliams, Research Triangle Institute, Research Triangle Park, NC
B. Cross, Crossroads Scientific, El Granada, CA
K. Lackey, Teck Alaska Inc, Kotzebue, AK

This workshop is designed to provide a discussion of the theoretical and practical aspects of EDXRF spectrometry providing a comprehensive review of the basic fundamentals for both the beginner and experienced X-ray spectroscopist. Topics to be covered include instrumentation, components, and applicability of EDXRF; ease of use; rapid qualitative analysis and material screening; calibration techniques for quantitative analysis; standardless analysis; sensitivity of EDXRF for a wide variety of elements in various matrices; and sample preparation. A variety of applications will be presented as real-life examples where EDXRF is being used to solve complex analytical problems. The workshop will appeal to both the beginner and experienced spectroscopist. The major emphases will be applicability of EDXRF and the optimal protocol for generating and reporting of reliable experimental results.
Tuesday am XRD
Rietveld Analysis I | Evergreen A
Organizers & Instructors:
J.A. Kaduk, Poly Crystallography Inc. and Illinois Institute of Technology, Naperville, IL, kaduk@polycrystallography.com
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY, misture@alfred.edu
T. Degen, PANalytical B.V., Almelo, The Netherlands

The workshop will cover the theory (briefly) and applications of Rietveld analysis. A broad range of applications will be covered, including: crystal structure and unit cell refinement, quantitative analysis, size and microstrain determination, texture analysis, and handling partially amorphous specimens. The instructors will provide not only traditional lectures but also will show live demonstrations of refinements, and will be happy to field questions during the demonstrations.

Phase Identification | Evergreen B
Organizers & Instructors:
T.G. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, fawcett@icdd.com
T.N. Blanton, Eastman Kodak Company Research Labs, Rochester, NY, thomas.blanton@kodak.com
C. Crowder, S.N. Kabekkodu, International Centre for Diffraction Data, Newtown Square, PA

Material identification methods using X-ray analyses have been known for over 75 years since the landmark 1936 publication of Hanawalt and Rinn. The fundamental principles have remained the same where unknown materials are compared to a series of reference materials, commonly referred to as a "fingerprint" technique. While the principles remain the same, there have been evolutionary changes in the algorithms used, the quality of data collected, the number of reference materials, and the accuracy and precision of both the experimental and reference data. In general, the evolution has been accomplished by integrating more information and more types of information in the phase identification process, using more powerful algorithms, and increasing the speed and accuracy of the analysis by using increasingly more powerful computers. Modern methods use total patterns, self analyzing and correcting software and sophisticated information filters and diagnostics. These tools are applied to both the experimental and reference data to obtain the best results. Overall, this results in having routine laboratory capabilities today that far exceed the capabilities of the method founders. In this workshop, we will discuss the evolutionary process, the best application of today's methods, diagnostic tools, and end with a discussion on new developments feeding the next stages of evolution.

Tuesday am XRF
Quantitative Analysis I | Evergreen C
Organizer & Instructors:
M. Mantler, Rigaku Corporation, Purkersdorf, Austria, michael.mantler@rigaku.com
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington APL, Seattle, WA

Basic Methods of Quantitative Analysis:
1. Theoretical and mathematical foundation: Classical fundamental parameter models.
2. Practical application: Working curves and influence coefficients, compensation methods.

Trace/TXRF Analysis | Evergreen D
Organizers & Instructors:
C. Streli, TU Wien, Atominstitut, Wien, Austria, streli@ati.ac.at
P. Wobrauschek, TU Wien, Atominstitut, Wien, Austria, wobi@ati.ac.at
K. Tsuji, Osaka City University, Osaka, Japan
A. Martin, Thermo Fisher Scientific, Sugarland, TX

This year's trace analysis workshop will provide an introduction of basic fundamentals in XRF, interesting for both beginners and experienced X-ray spectroscopists. Main topics to be covered are presentations of most modern techniques and instrumentation for trace element analysis. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; Special emphasis will be on Synchrotron radiation as an excitation source. Introduction to total reflection XRF (TXRF) and actual instrumentation is another point of interest and will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (e.g., Carbon). Confocal μ-XRF will be presented as method for 2D and 3D spatially resolved elemental imaging. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use and importance of the various XRF spectrometric techniques.
Tuesday pm XRD & XRF
Cultural Heritage | Evergreen B
Organizers & Instructors:
A. Karydas, International Atomic Energy Agency, Vienna, Austria, a.karydas@iaea.org
M.K. Donais, Saint Anselm College, Manchester, NH, mdonais@anselm.edu
A. Heginbotham, J. Paul Getty Museum, Los Angeles, CA
V.A. Solé, European Synchrotron Radiation Facility, Grenoble, France
T. Wolff, Analytische Roentgenphysik - Institut fuer Optik und Atomare Physik, Berlin, Germany

The workshop will review the current status and exploit the challenges and perspectives for XRF calibration and quantification of cultural heritage materials using fundamental parameter-based methodologies. Applications using handheld analyzers, laboratory or portable milli- or 2D/3D micro- XRF instrumentation for a variety of samples from paper to metals will be demonstrated to illustrate concepts. Best practices that can improve data reproducibility and assessment will be discussed also.

Tuesday pm XRD
Rietveld Analysis II | Evergreen A
Organizers & Instructors:
J.A. Kaduk, Poly Crystallography Inc. and Illinois Institute of Technology, Naperville, IL, kaduk@polycrystallography.com
S.T. Misture, NYS College of Ceramics at Alfred University, Alfred, NY, misture@alfred.edu
T. Degen, PANalytical B.V., Almelo, The Netherlands

Continuation of Rietveld Analysis I.

Tuesday pm XRF
Quantitative Analysis II | Evergreen C
Organizer & Instructors:
M. Mantler, Rigaku Corporation, Purkersdorf, Austria, michael.mantler@rigaku.com
B. Vrebos, PANalytical, Almelo, The Netherlands
W.T. Elam, University of Washington APL, Seattle, WA

Fundamental Parameters in XRF:
Fundamental parameters for XRF include all physical constants related to the excitation and measurement of X-rays such as attenuation coefficients (total, subshell, coherent/incoherent scattering), binding energies of electrons (hence also line energies), transition probabilities, probabilities for radiative and non-radiative transitions (Auger, Coster-Kronig), as well as data related to interactions by electrons. By convention, tube spectra are sometimes included also.

The following topics intend to complement, at an introductory level, the special session dedicated to fundamental parameters during the regular scientific part of DXC 2012:

Available collections of fundamental parameters. Sources for download.
Reliability of data as a function of element and line-energy (and related sub-shells). This refers in particular to the range of light elements and low energy lines (L, M-lines).
The influence of chemical state.
Propagation of errors in fundamental parameters to the analytical result (classical methods with reference materials; reference free methods).
The International Initiative on X-ray Fundamental Parameters.
XRF Sample Preparation | Evergreen D
Organizer & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, jaanzelmo@aol.com
P. Ricou, Arkema, Inc., King of Prussia, PA
M.E. Provencher, Corporation Scientifique Claisse, Quebec, Canada

This workshop will discuss basic and fundamental considerations with respect to specimen preparation for XRF by pressed powder and fusion with a special session devoted to the preparation of plastics.

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